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手持式四探針方阻測試儀

一.概述Overview：

參照硅片電阻率測量的標準（ASTM F84）及標準設計制造該儀器設計符合GB/T 1551-2009 《硅單晶電阻率測定方法》、GB/T 1551-1995《硅、鍺單晶電阻率測定直流兩探針法》、GB/T 1552-1995《硅、鍺單晶電阻率測定直流四探針法》，采集高集成電路恒流源系統(tǒng)，提供便捷的操作模式，便攜式外型結構，可充電式電源系統(tǒng)，超長待機，上下限設定.Reference  Silicon resistivity measurement international standards (ASTM F84) and national standard design and manufacture of the equipment is designed in accordance with GB/T 1551-2009 "Method of determination of silicon single crystal resistivity”. GB/T 1551-1995" the single crystal silicon. germanium resistivity measurement of DC double probe method”. GB/T 1552-1995 "the single crystal silicon. germanium resistivity measuring DC four-probe method".  With High precision intensive circuit constant current source system. Provide a convenient  operation mode. portable appearance structure. Rechargeable power supply system. Super long standby time. Upper and lower set.

手持式四探針方阻測試儀

二.功能介紹Function introduction：

便攜式外型結構更加適用于車間生產(chǎn)、品管抽檢，外出攜帶測量等要求快速便捷測量的場所；也適用于中小型半導體材料生產(chǎn)企業(yè).具有高.

The portable external structure is more suitable for the place where the production of the workshop. the quality of the product. and the measurement of the outside etc. that require quick and easy measurements . It is also suitable for small and medium semiconductor manufacturing enterprises. It has a high performance-price ratio  advantage.


手持式四探針方阻測試儀

三技術參數(shù)Technical Parameters：